A better way to extract your signal from the noise

During material or device characterization, lock-in amplifiers enable one to measure very low amplitudes of the frequency of interest in the presence of large broadband noise and large spurious signals at other frequencies. 

This app note examines how the lock-in technology employed in a new, modular source measure architecture deals with removing the effects of noise from the measurement. It details how the new M81-SSM architecture offers: 

• Filters designed to remove noise and decrease measurement time.
• Multiple measure options, with the flexibility of measurement configurations
• Multiple source modules, which can be matched to measurement requirements