Common-mode Artifacts in 2D Materials with Significant Contact Resistance

app-brief-2d-artifacts

 

Explore the complexities of common-mode artifacts in 2D materials with significant contact resistance in our detailed application brief

Learn how traditional measurement setups can lead to errors and inaccuracies in resistance measurements due to signal conversion within the sample. Discover the benefits of using a balanced current source and high input impedance voltmeter to mitigate these artifacts and improve measurement accuracy.  Enhance your understanding of resistance measurements in 2D materials and optimize your experimental setup with insights from our comprehensive analysis.